
Intel® Workstation Board S5520SC TPS Design and Environmental Specifications
Revision 1.7
Intel order number: E39530-010
127
9. Design and Environmental Specifications
9.1 Intel
®
Workstation Board S5520SC Design Specifications
Operation of the Intel
®
Workstation Board S5520SC at conditions beyond those listed in the
following table may cause permanent damage to the system. Exposure to absolute maximum
rating conditions for extended periods may affect system reliability.
Table 75. Workstation Board Design Specifications
Operating Temperature 0º C to 55º C 1 (32º F to 131º F)
Non-Operating Temperature -40º C to 70º C (-40º F to 158º F)
DC Voltage ± 5% of all nominal voltages
Shock (Unpackaged) Trapezoidal, 50 G, 170 inches/sec
Shock (Packaged)
< 20 pounds
20 to < 40 pounds
40 to < 80 pounds
80 to < 100 pounds
100 to < 120 pounds
120 pounds
36 inches
30 inches
24 inches
18 inches
12 inches
9 inches
Vibration (Unpackaged) 5 Hz to 500 Hz 3.13 g RMS random
Note:
1
Chassis design must provide proper airflow to avoid exceeding the processor maximum case temperature.
Disclaimer Note: Intel Corporation server and workstation boards contain a number of high-
density VLSI and power delivery components that need adequate airflow to cool. Intel ensures
through its own chassis development and testing that when Intel
®
server/workstation building
blocks are used together, the fully integrated system will meet the intended thermal
requirements of these components. It is the responsibility of the system integrator who chooses
not to use Intel
®
developed server/workstation building blocks to consult vendor datasheets and
operating parameters to determine the amount of airflow required for their specific application
and environmental conditions. Intel Corporation cannot be held responsible, if components fail
or the server or workstation board does not operate correctly when used outside any of its
published operating or non-operating limits.
9.2 MTBF
The following is the calculated Mean Time Between Failures (MTBF) 30°C (ambient air). These
values are derived using a historical failure rate and multiplied by factors for application,
electrical and/or thermal stress and for device maturity. You should MTBF estimates as
“reference numbers” only.
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